DocumentCode :
1165298
Title :
Modeling of Micropitch Shift of a Magnetoelectrical Sensor During Laser Solder Ball Bonding Process
Author :
Tian, Dewen ; Wang, Chunqing ; Tian, Yanhong
Author_Institution :
Harbin Inst. of Technol., Harbin
Volume :
32
Issue :
1
fYear :
2009
Firstpage :
136
Lastpage :
145
Abstract :
With the development of optoelectronics and microelectromechanical systems (MEMS) packaging, laser soldering has become an extensively used interconnection technique in electronic manufacturing industry. Postsolder shift in assembling of such components is the most challenging issue to affect the packaging yields. To maintain a high coupling efficiency or accuracy, tight control of postsolder shift is required. In the present work, a 3-D thermal-mechanical coupled finite element model was developed to investigate the time-dependent pitch shift induced by the laser solder ball bonding process. This model accounted for the laser interaction, the heat conduction, the thermal induced deformation and the phase change of the solder and could reflect the actual laser soldering process. The modeling results show different deformation mechanisms in the prebumping and reflow processes. The pitch shift is mainly induced by the thermal shrinkage of solder. The pitch angles obtained from the finite element analysis are in good agreement with those from the measurement using laser goniometer.
Keywords :
bonding processes; deformation; finite element analysis; laser beam applications; microsensors; soldering; 3-D thermal-mechanical coupled finite element model; actual laser soldering process; finite element analysis; heat conduction; interconnection technique; laser solder ball bonding process; laser soldering; magnetoelectrical sensor; microelectromechanical system packaging; micropitch shift; thermal induced deformation; thermal shrinkage; Bonding processes; Deformable models; Electronic packaging thermal management; Finite element methods; Laser modes; Laser transitions; Magnetic sensors; Microelectromechanical systems; Semiconductor device modeling; Soldering; Finite element; laser solder ball bonding; modeling; postsolder shift;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2008.2008634
Filename :
4785304
Link To Document :
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