• DocumentCode
    1165311
  • Title

    High Temperature Characteristics of Coplanar Waveguide on R-Plane Sapphire and Alumina

  • Author

    Ponchak, George E. ; Jordan, Jennifer L. ; Scardelletti, Maximilian C.

  • Author_Institution
    NASA Glenn Res. Center, Cleveland, OH
  • Volume
    32
  • Issue
    1
  • fYear
    2009
  • Firstpage
    146
  • Lastpage
    151
  • Abstract
    This paper presents the characteristics of coplanar waveguide transmission lines on R-plane sapphire and alumina over the temperature range of 25degC-400degC and the frequency range of 45 MHz-50 GHz. A thru-reflect-line calibration technique and open circuited terminated stubs are used to extract the attenuation and effective permittivity. It is shown that the effective permittivity of the transmission lines and, therefore, the relative dielectric constant of the two substrates increase linearly with temperature. The attenuation of the coplanar waveguide varies linearly with temperature through 200degC, and increases at a greater rate above 200degC.
  • Keywords
    calibration; coplanar transmission lines; coplanar waveguides; permittivity; Al2O3; R-plane sapphire; alumina; coplanar waveguide attenuation; coplanar waveguide transmission lines; dielectric constant; effective permittivity; frequency 45 MHz to 50 GHz; open circuited terminated stubs; temperature 25 degC to 400 degC; thru-reflect-line calibration method; Attenuation; Calibration; Coplanar transmission lines; Coplanar waveguides; Dielectric constant; Dielectric substrates; Distributed parameter circuits; Frequency; Permittivity; Temperature distribution; Alumina; attenuation; coplanar waveguide; effective permittivity; high temperature; sapphire;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2008.2009123
  • Filename
    4785306