DocumentCode
1165311
Title
High Temperature Characteristics of Coplanar Waveguide on R -Plane Sapphire and Alumina
Author
Ponchak, George E. ; Jordan, Jennifer L. ; Scardelletti, Maximilian C.
Author_Institution
NASA Glenn Res. Center, Cleveland, OH
Volume
32
Issue
1
fYear
2009
Firstpage
146
Lastpage
151
Abstract
This paper presents the characteristics of coplanar waveguide transmission lines on R-plane sapphire and alumina over the temperature range of 25degC-400degC and the frequency range of 45 MHz-50 GHz. A thru-reflect-line calibration technique and open circuited terminated stubs are used to extract the attenuation and effective permittivity. It is shown that the effective permittivity of the transmission lines and, therefore, the relative dielectric constant of the two substrates increase linearly with temperature. The attenuation of the coplanar waveguide varies linearly with temperature through 200degC, and increases at a greater rate above 200degC.
Keywords
calibration; coplanar transmission lines; coplanar waveguides; permittivity; Al2O3; R-plane sapphire; alumina; coplanar waveguide attenuation; coplanar waveguide transmission lines; dielectric constant; effective permittivity; frequency 45 MHz to 50 GHz; open circuited terminated stubs; temperature 25 degC to 400 degC; thru-reflect-line calibration method; Attenuation; Calibration; Coplanar transmission lines; Coplanar waveguides; Dielectric constant; Dielectric substrates; Distributed parameter circuits; Frequency; Permittivity; Temperature distribution; Alumina; attenuation; coplanar waveguide; effective permittivity; high temperature; sapphire;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2008.2009123
Filename
4785306
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