DocumentCode :
1165311
Title :
High Temperature Characteristics of Coplanar Waveguide on R-Plane Sapphire and Alumina
Author :
Ponchak, George E. ; Jordan, Jennifer L. ; Scardelletti, Maximilian C.
Author_Institution :
NASA Glenn Res. Center, Cleveland, OH
Volume :
32
Issue :
1
fYear :
2009
Firstpage :
146
Lastpage :
151
Abstract :
This paper presents the characteristics of coplanar waveguide transmission lines on R-plane sapphire and alumina over the temperature range of 25degC-400degC and the frequency range of 45 MHz-50 GHz. A thru-reflect-line calibration technique and open circuited terminated stubs are used to extract the attenuation and effective permittivity. It is shown that the effective permittivity of the transmission lines and, therefore, the relative dielectric constant of the two substrates increase linearly with temperature. The attenuation of the coplanar waveguide varies linearly with temperature through 200degC, and increases at a greater rate above 200degC.
Keywords :
calibration; coplanar transmission lines; coplanar waveguides; permittivity; Al2O3; R-plane sapphire; alumina; coplanar waveguide attenuation; coplanar waveguide transmission lines; dielectric constant; effective permittivity; frequency 45 MHz to 50 GHz; open circuited terminated stubs; temperature 25 degC to 400 degC; thru-reflect-line calibration method; Attenuation; Calibration; Coplanar transmission lines; Coplanar waveguides; Dielectric constant; Dielectric substrates; Distributed parameter circuits; Frequency; Permittivity; Temperature distribution; Alumina; attenuation; coplanar waveguide; effective permittivity; high temperature; sapphire;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2008.2009123
Filename :
4785306
Link To Document :
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