DocumentCode :
1165329
Title :
A normalized-area measure for VLSI layouts
Author :
Krishnan, Musaravakkam S. ; Hayes, John P.
Author_Institution :
Xerox Corp., El Segundo, CA, USA
Volume :
7
Issue :
3
fYear :
1988
fDate :
3/1/1988 12:00:00 AM
Firstpage :
411
Lastpage :
419
Abstract :
A figure of merit called normalized-area, is introduced for the purpose of evaluating layouts for VLSI networks. This measure is distinctly different from the existing VLSI measures in two major aspects: (1) it expresses the utilization of the layout area by revealing the constant factor hidden in its asymptotic area-complexity; and (2) it distinguishes between node and wire sizes. Normalized-area is valuable in evaluating alternative layouts for a given structure as well as in analyzing the area utilization of a particular layout for that structure in an absolute sense. An analysis of the normalized-area of the layout schemes for regular structures proposed in the literature shows that most of these schemes are infeasible in practice. Array realizations for several well-known regular structures are used to demonstrate the usefulness of the normalized-area measure. Some practical guidelines for placement and routing to achieve good area utilization in a VLSI chip are presented
Keywords :
VLSI; circuit layout CAD; CAD; VLSI layouts; asymptotic area-complexity; figure of merit; normalized-area measure; placement; routeing; routing; Area measurement; Guidelines; Helium; Integrated circuit interconnections; Printed circuits; Routing; Semiconductor device measurement; Size measurement; Very large scale integration; Wire;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.3174
Filename :
3174
Link To Document :
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