DocumentCode :
1165330
Title :
A family of high-swing CMOS operational amplifiers
Author :
Fiez, Terri S. ; Yang, Howard C. ; Yang, John J. ; Yu, Choung ; Allstot, David J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume :
24
Issue :
6
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
1683
Lastpage :
1687
Abstract :
A family of high-swing CMOS operational amplifiers has been developed to maximize the available dynamic range with low supply voltages. Complementary differential pairs are used to achieve an almost rail-to-rail input common-mode voltage range. High linearity is obtained by summing currents so that the small-signal differential-mode voltage gain is constant over the entire input common-mode range. With a 5.0-V power supply, the total harmonic distortion is typically only 1% in a unity-gain configuration with a 4.5-Vp-p signal. The measured DC offset voltages versus input common-mode range track between the conventional and high-swing versions. These measurements suggest that the commonly feared crossover distortion may not be a problem when the current summation high-swing topology is used. The measured step response characteristics were excellent and exhibited no signs of phase mismatch crossover distortion for high-frequency signals
Keywords :
CMOS integrated circuits; differential amplifiers; linear integrated circuits; operational amplifiers; 5 V; CMOS; DC offset voltages; complementary differential pairs; current summation high-swing topology; differential-mode voltage gain; high swing op. amp. family; high-frequency signals; linear IC; low supply voltages; monolithic type; operational amplifiers; step response characteristics; total harmonic distortion; unity-gain configuration; Current measurement; Distortion measurement; Dynamic range; Linearity; Low voltage; Operational amplifiers; Power supplies; Rail to rail inputs; Topology; Total harmonic distortion;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.45006
Filename :
45006
Link To Document :
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