DocumentCode
1165490
Title
Assessment of Fluxless Solid Liquid Interdiffusion Bonding by Compressive Force of Au-PbSn and Au-SAC for Flip Chip Packaging
Author
Lee, Teck Kheng ; Zhang, Sam ; Wong, Chee C. ; Tan, A.C.
Author_Institution
Micron Semicond. Asia, Singapore
Volume
32
Issue
1
fYear
2009
Firstpage
116
Lastpage
122
Abstract
Flip chip packaging faces two primary bonding-process obstacles: flux use and geometry mismatch between die and substrate pad pitch. These obstacles motivated the development of a fluxless bonding method called solid-liquid interdiffusion bonding by compressive force (SLICF). SLICF utilizes a mechanical force to form the bond through solid-liquid interdiffusion with a joint-in-via (JIV) architecture for flip chip packaging. SLICF bonding (also known as thermo-mechanical (TM) bonding) forms an instantaneous bond and eliminates the need for reflow infrastructure. Both Au-PbSn and Au-SAC interconnect systems were studied for the SLICF bonding on the JIV architecture at a 130- mum pitch. The morphologies of Au-PbSn and Au-SAC in solid-liquid interdiffusion were studied with their kinetics measured by the Au consumption rate. The SLIFC bonds for Au-PbSn and Au-SAC were compared and assessed by mechanical shear tests and thermomechanical stresses. Au with PbSn was found to perform marginally better due to its joint geometry and slower kinetics.
Keywords
chemical interdiffusion; circuit reliability; copper alloys; diffusion bonding; electronics packaging; flip-chip devices; gold; lead alloys; microassembling; reflow soldering; silver alloys; thermomechanical treatment; tin alloys; Au-PbSn; Au-SnAgCu; compressive force; flip chip packaging; fluxless bonding method; fluxless solid-liquid interdiffusion bonding; interconnect systems; joint geometry; joint-in-via architecture; mechanical force; mechanical shear tests; reflow infrastructure; size 130 mum; thermo-mechanical bonding; thermomechanical stresses; Bonding forces; Flip chip; Geometry; Gold; Kinetic theory; Morphology; Packaging; Solids; Testing; Thermomechanical processes; Bonding; flip chip; fluxless; gold; lead free; solder;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2008.2006650
Filename
4785323
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