Title :
Boundary scan test standards
Author :
Ashenden, Peter J.
Author_Institution :
Ashenden Designs, Stirling, SA, Australia
Abstract :
I give an overview of several standards defining test technology based on boundary scan. The Test Technology Technical Council (MC), an IEEE Computer Society technical committee, sponsors these standards.
Keywords :
IEEE standards; boundary scan testing; IEEE Computer Society technical committee; Test Technology Technical Council; boundary scan test standards; Conferences; EPROM; Electronics industry; Field programmable gate arrays; Flash memory; Programmable logic devices; Read only memory; Standards development; System-on-a-chip; Testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1189240
