• DocumentCode
    1165776
  • Title

    Interval graph algorithms for two-dimensional multiple folding of array-based VLSI layouts

  • Author

    Ho, King C. ; Vrudhula, Sarma B K

  • Author_Institution
    Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    13
  • Issue
    10
  • fYear
    1994
  • fDate
    10/1/1994 12:00:00 AM
  • Firstpage
    1201
  • Lastpage
    1222
  • Abstract
    Folding or topological compaction of array-based VLSI layouts is an important optimization step that is carried out after logic synthesis. In this paper, a new approach to two-dimensional multiple folding of array-based VLSI layouts is presented. From the specification of the problem a pair of intersection graphs is created. We show that any pair of interval graphs that contain the intersection graphs as spanning subgraphs corresponds to a set of feasible foldings. Next, a complete and exact characterization of the folding problem is presented. In particular, it is shown that the set of all feasible foldings associated with a given pair of interval graphs corresponds to the set of independent colorings of a pair of compatibility graphs. The compatibility graphs are derived from a pair of interval graphs that contain the intersection graphs as spanning subgraphs. Thus, minimizing the area of a layout is tantamount to finding a pair of compatibility graphs such that the product of their chromatic numbers is minimum. As important as minimizing the area of a layout is, the ability to rapidly generate compact layouts over a wide range of aspect ratios is often equally, if not more, important. The interval graph-based formulation of the folding problem permits a controlled and systematic generation of compact layouts with varying aspect ratios. Efficient and provably correct algorithms to generate compact layouts that have a given number of rows or a given number of columns within their minimum and maximum possible values are given. The basic theory and methods are extended to include I/O and other types of constraints. Finally, the results of experiments that were carried out on a large number of benchmark problems are given. These results are compared with those obtained by previously reported methods
  • Keywords
    VLSI; circuit layout CAD; graph colouring; logic CAD; logic arrays; network topology; array-based VLSI layouts; aspect ratios; benchmark problems; chromatic numbers; compatibility graphs; independent colorings; interval graph algorithms; logic arrays; optimization step; spanning subgraphs; topological compaction; two-dimensional multiple folding; Compaction; Constraint theory; Control systems; Logic arrays; Programmable logic arrays; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.317463
  • Filename
    317463