DocumentCode :
1166110
Title :
Low-loss, single-model optical phase modulator in SIMOX material
Author :
Tang, C.K. ; Reed, G.T. ; Walton, A.J. ; Rickman, A.G.
Author_Institution :
Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
Volume :
12
Issue :
8
fYear :
1994
fDate :
8/1/1994 12:00:00 AM
Firstpage :
1394
Lastpage :
1400
Abstract :
This paper reports results of the simulation of an optical phase modulator. The proposed modulator consists of an elongated p-i-n structure fabricated in a silicon-on-insulator material such as SIMOX. It utilizes the free-carrier effect to produce the desired refractive index change in a single-mode optical rib waveguide. The MEDICI two-dimensional semiconductor device simulation package has been employed to optimize the overlap between the injected free carriers and the propagating optical guided mode. Although the device is designed to support a single optical guided mode, it measures several micrometers in cross-sectional dimensions, thereby simplifying fabrication and allowing efficient coupling to/from other single-mode devices. Furthermore, the device has an extremely high figure of merit, predicting over 200° of induced phase shift per volt per millimeter, as well as a low drive current of less than 10 mA. This is approximately an order of magnitude lower than most other reported devices in silicon
Keywords :
SIMOX; integrated optics; light refraction; optical losses; optical modulation; optical waveguides; phase modulation; refractive index; MEDICI two-dimensional semiconductor device simulation package; SIMOX material; Si; figure of merit; free-carrier effect; induced phase shift; losses; optical guided mode propagation; optical phase modulator; optical rib waveguide; p-i-n structure; refractive index; Biomedical optical imaging; Medical simulation; Optical devices; Optical materials; Optical modulation; Optical refraction; Optical variables control; Optical waveguides; Phase change materials; Phase modulation;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.317527
Filename :
317527
Link To Document :
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