Title :
Peculiarity of multi-splitting filtering technology
Author_Institution :
A.V. Rzhanov Inst. of Semicond. Phys., Novosibirsk, Russia
Abstract :
The paper presents the review of basic results which described the optical properties of novel optical filter/multiplexer constructed by multiply coupled wave-guides. For the study, a modified effective index method (MEIM), has been used. It correctly describes, in the 2D case both the phase and the group indexes in a 3D silicon wire waveguide and makes it possible to simulate complicated SOI structures by 2D finite difference time domain method (FDTD). The silicon wire crossings are realized by means of a vertical up and down coupling through the silica buffer of tapered Si wires with the upper thick polymer waveguide. FDTD modeling prove that a short 0.26 mm multiplexer with 32 couplers has FSR 35 nm, spectral resolutions 1.4 nm, internal loss -0.7 dB and sidelobes -20 dB.
Keywords :
elemental semiconductors; finite difference time-domain analysis; integrated optics; multiplexing equipment; optical directional couplers; optical filters; optical losses; optical polymers; optical waveguide filters; silicon; silicon-on-insulator; 2D finite difference time domain method; 3D silicon wire waveguide; FSR; SOI structures; Si; couplers; internal loss; modified effective index method; multiply coupled waveguides; multisplitting filtering technology; optical filter/multiplexer; optical properties; sidelobes; silica buffer; silicon wire crossings; size 0.26 mm; spectral resolutions; tapered Si wires; upper thick polymer waveguide; Finite difference methods; Indexes; Optical filters; Optical waveguides; Silicon; Three-dimensional displays; Wires; Add-drop multiplexers; Directional couplers; Finite difference methods; Integrated optics; Numerical simulation; Optical waveguides; Silicon-on-insulator; optical filters;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2014 12th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4799-6019-4
DOI :
10.1109/APEIE.2014.7040720