• DocumentCode
    1166378
  • Title

    Dynamic Ward equivalents for transient stability analysis

  • Author

    Baldwin, Thomas L. ; Mili, Lamine ; Phadke, Arun G.

  • Author_Institution
    Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    9
  • Issue
    1
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    59
  • Lastpage
    67
  • Abstract
    In an effort to reduce the computing time of transient stability assessment, the paper presents a dynamic equivalent which results from the elimination of the load buses provided with voltage-dependent loads. The elimination is performed through a new version of the Ward equivalencing method. In this approach, the equivalent current injections are expressed in terms of the retained bus angles and a sensitivity matrix W_¯. The nonlinearity of the load flow model is accounted for through piecewise linear approximations by updating the W_¯ matrix whenever the operating point moves beyond the validity of the linearization. The paper also derives the expressions of the incremental changes in the generator electric power and the transient energy function for the reduced system. The approach has been tested on several systems with different sizes and characteristics
  • Keywords
    load flow; matrix algebra; power system stability; power system transients; Ward equivalencing method; dynamic Ward equivalents; equivalent current injections; generator electric power function; load buses; load flow model nonlinearity; piecewise linear approximations; power systems; retained bus angles; sensitivity matrix; transient energy function; transient stability analysis; transient stability assessment; voltage-dependent loads; Load flow; Load modeling; Power generation; Power system analysis computing; Power system dynamics; Power system stability; Power system transients; Stability analysis; Transient analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.317557
  • Filename
    317557