DocumentCode :
1167610
Title :
An In/sub 0.52/Al/sub 0.48/As/n/sup +/-In/sub 0.53/Ga/sub 0.47/As MISFET with a modulation-doped channel
Author :
del Alamo, Jesús A. ; Mizutani, Takashi
Author_Institution :
NTT LSI Lab., Atsugi, Japan
Volume :
10
Issue :
8
fYear :
1989
Firstpage :
394
Lastpage :
396
Abstract :
A heterostructure metal-insulator-semiconductor field-effect transistor (MISFET) with a modulation-doped channel is proposed. In this device, a very thin undoped subchannel is located between the undoped wide-bandgap insulator and a thin heavily doped channel. In the depletion mode of operation, electron transport takes place along the heavily doped channel. When the device enters the accumulation mode of operation, electrons pile up against the heterointerface in the high-mobility undoped subchannel. This results in markedly improved transport characteristics at the onset of accumulation. The concept is demonstrated in the In/sub 0.52/Al/sub 0.48/As/In/sub 0.53/Ga/sub 0.47/As system on InP. A 1.5- mu m-gate-length MISFET shows a unity current-gain cutoff frequency of 37 GHz.<>
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; insulated gate field effect transistors; solid-state microwave devices; 1.5 micron; 37 GHz; In/sub 0.52/Al/sub 0.48/As-In/sub 0.53/Ga/sub 0.47/As; InP; MISFET; accumulation mode; depletion mode; electron transport; gate length; high-mobility undoped subchannel; microwave measurement; modulation-doped channel; thin heavily doped channel; thin undoped subchannel; undoped wide-bandgap insulator; unity current-gain cutoff frequency; Electrons; Epitaxial layers; FETs; HEMTs; Indium phosphide; Insulation; MISFETs; MODFETs; Metal-insulator structures; Substrates;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.31768
Filename :
31768
Link To Document :
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