Title :
Denver Hosts Technical Seminars on Cutting-Edge CMOS Technology and High-Speed Test
Author :
Loke, Alvin ; Barnes, Bob ; Wee, Tin Tin
Author_Institution :
Denver Chapter Chair, alvin.loke@ieee.org
Abstract :
In the past year, the Denver SSCS Chapter hosted eight monthly seminars, including four by SSCS Distinguished Lecturers. These talks spanned a variety of exciting developments in IC design, cutting-edge CMOS technology, and high-speed test.
Journal_Title :
Solid-State Circuits Society Newsletter, IEEE
DOI :
10.1109/N-SSC.2007.4785554
