• DocumentCode
    1167740
  • Title

    Denver Hosts Technical Seminars on Cutting-Edge CMOS Technology and High-Speed Test

  • Author

    Loke, Alvin ; Barnes, Bob ; Wee, Tin Tin

  • Author_Institution
    Denver Chapter Chair, alvin.loke@ieee.org
  • Volume
    12
  • Issue
    1
  • fYear
    2007
  • Firstpage
    72
  • Lastpage
    73
  • Abstract
    In the past year, the Denver SSCS Chapter hosted eight monthly seminars, including four by SSCS Distinguished Lecturers. These talks spanned a variety of exciting developments in IC design, cutting-edge CMOS technology, and high-speed test.
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits Society Newsletter, IEEE
  • Publisher
    ieee
  • ISSN
    1098-4232
  • Type

    jour

  • DOI
    10.1109/N-SSC.2007.4785554
  • Filename
    4785554
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1167740