• DocumentCode
    1167811
  • Title

    PRML channel performance under the influence of medium noise in tape recording systems

  • Author

    Luo, Peng ; Jin, Zhen ; Bertram, H. Neal

  • Author_Institution
    Center for Magnetic Recording Res., Univ. of California, La Jolla, CA, USA
  • Volume
    39
  • Issue
    2
  • fYear
    2003
  • fDate
    3/1/2003 12:00:00 AM
  • Firstpage
    1072
  • Lastpage
    1080
  • Abstract
    Previous studies have shown that tape medium noise is dominated by surface roughness. Here, we use error rate analysis to evaluate the effects of surface roughness as well as particle size distributions in a partial-response maximum-likelihood (PRML) channel. We use: 1) a modified self-consistent model, incorporating a log-normal particle size distribution and a random packing of the particles to simulate the recording process and 2) a predeveloped error rate model to evaluate the system performance with fixed head/medium combinations. Surface roughness is introduced as a varying random head/tape spacing during both the recording and the playback processes. The impact of mean particle length, roughness variance, and roughness correlation length on system performance is examined for a partial response (PR4) channel. A surface roughness variance changing from 5 to 10 nm yields, at 200 kfci with a particle length of 60 nm, a change of error rate from 10-10 to 10-5. Because of the finite head read track width, roughness with shorter correlation lengths can be cross-track-averaged more readily and yields better system performance. We also found that larger particle size media have higher DC noise but lower roughness-induced transition noise. The shorter-particle-size media give better system performance, and the advantage increases with reducing roughness variance.
  • Keywords
    digital magnetic recording; error statistics; log normal distribution; magnetic recording noise; magnetic tape storage; maximum likelihood detection; partial response channels; particle size; surface topography; 5 to 10 nm; 60 nm; DC noise; PR4 channel; PRML channel performance; error rate analysis; error rate model; fixed head/medium combinations; log-normal particle size distribution; magnetic tape; mean particle length; modified self-consistent model; partial-response ML channel; partial-response maximum-likelihood channel; playback process; random particle packing; recording process; roughness correlation length; roughness variance; roughness-induced transition noise; surface roughness; system performance evaluation; tape medium noise; tape recording systems; varying random head/tape spacing; Atmospheric modeling; Colored noise; Error analysis; Fluctuations; Magnetic heads; Magnetic noise; Magnetic recording; Rough surfaces; Surface roughness; System performance;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2003.808596
  • Filename
    1190072