Title :
Inactivity Windows in Irradiated CMOS Analog Switches
Author :
Franco, F.J. ; Zong, Y. ; Agapito, J.A.
Author_Institution :
Univ. Complutense de Madrid
Abstract :
Radiation tests have shown the existence of inactivity windows in analog switches. It means that the devices lose their ability to switch between ON and OFF states if the total radiation dose is placed between two characteristic values. Once the total radiation dose goes beyond the top value of the window, the switching ability reappears. A physical mechanism based on the evolution of the threshold voltage of irradiated NMOS transistors is proposed in this paper. Finally, consequences of inactivity windows in the conception of radiation tests are discussed
Keywords :
CMOS analogue integrated circuits; field effect transistor switches; radiation effects; semiconductor device testing; CMOS analog switch; NMOS transistor irradiation; inactivity windows; on-off state; physical mechanism; radiation testing; total ionizing dose; Electron accelerators; Instruments; Ion accelerators; Ionizing radiation; Large Hadron Collider; Neutrons; Particle beams; Superconducting magnets; Switches; Testing; Analog switches; complementary metal–oxide semiconductor (CMOS) devices; total ionizing dose (TID);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.880474
