DocumentCode :
1168399
Title :
ISSCC 2007 panel review: the ultimate limits of integrated electronics
Author :
Pamarti, Sudhakar
Author_Institution :
UCLA, CA, USA
Volume :
12
Issue :
3
fYear :
2007
Firstpage :
29
Lastpage :
29
Abstract :
SSCS DL Philip Wong moderated a lively debate on the question of CMOS scaling. Representatives from industry pointed to limits and problems introduced by economies of variability, leakage, and 32nm node scaling; academics painted these challenges as opportunities for innovation and major breakthroughs. Deliberation about 3D chip stacking was the highpoint of the evening.
fLanguage :
English
Journal_Title :
Solid-State Circuits Society Newsletter, IEEE
Publisher :
ieee
ISSN :
1098-4232
Type :
jour
DOI :
10.1109/N-SSC.2007.4785627
Filename :
4785627
Link To Document :
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