DocumentCode
1168817
Title
Design, fabrication, and testing of an integrated Si-based light modulator
Author
Sciuto, Antonella ; Libertino, Sebania ; Alessandria, Antonio ; Coffa, Salvo ; Coppola, Giuseppe
Author_Institution
Dept. of Phys., Univ. of Catania, Italy
Volume
21
Issue
1
fYear
2003
fDate
1/1/2003 12:00:00 AM
Firstpage
228
Lastpage
235
Abstract
We have fabricated and characterized a novel Si-based light modulator working at the standard communication wavelength of 1.5 μm. It consists of a three-terminal bipolar mode field effect transistor integrated with a silicon rib waveguide on epitaxial Si wafers. The modulator optical channel is embodied within its vertical electrical channel. Light modulation is achieved moving a plasma of carriers inside and outside the optical channel by properly biasing the control electrode. The carriers produce an increase of the Si absorption coefficient. The devices have been fabricated using clean-room processing. Detailed electrical characterization and device simulations confirm that strong conductivity modulation and plasma formation in the channel are achieved. The plasma distribution in the device under different bias conditions has been directly derived from emission microscopy analyses. The device performances in terms of modulation depth will be presented.
Keywords
absorption coefficients; bipolar integrated circuits; electro-optical modulation; integrated optics; integrated optoelectronics; optical communication equipment; optical design techniques; optical fabrication; optical testing; optical waveguides; rib waveguides; semiconductor plasma; silicon; 1.5 micron; Si; Si absorption coefficient; bias conditions; carrier plasma; clean-room processing; control electrode; device performances; device simulations; electrical characterization; emission microscopy analyses; epitaxial Si wafers; integrated Si-based light modulator design; integrated Si-based light modulator fabrication; integrated Si-based light modulator testing; light modulation; modulation depth; modulator optical channel; plasma distribution; plasma formation; silicon rib waveguide; standard communication wavelength; strong conductivity modulation; three-terminal bipolar mode field effect transistor; vertical electrical channel; Communication standards; FETs; Optical device fabrication; Optical modulation; Optical waveguides; Plasma devices; Plasma materials processing; Plasma simulation; Silicon; Testing;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2003.808608
Filename
1190169
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