Diminishment of Spark Damages in MGCs by Using Diamond Thin Films

Author

Hou, Zhongyu ; Chen, Changxin ; Wang, Yun ; Wei, Xing ; Bian, Jianjiang ; Xu, Dong ; Cai, Bingchu

Author_Institution

Nat. Key Lab. of Nano/Micro Fabrication Technol., Shanghai Jiao Tong Univ.

Volume

53

Issue

4

fYear

2006

Firstpage

2288

Lastpage

2295

Abstract

A simulation method on estimation of the anode material damage caused by spark discharges is developed. These discharges are well known to cause permanent failures of microgap gas chambers (MGCs). Systematic analysis and optimization studies have been performed through finite element methods (FEM) simulations using Ansys6.1. The results have evidently shown that, owing to their super high heat conductivity, introduction of diamond thin films (DTFs) as an insulating layer can enormously diminish or even avoid melting or vaporizing of the anodes via spark discharges. Furthermore, topological optimization and anode material selection studies using the FEM simulation technique have been carried out to enhance MGC operational stability. Samples based on the simulation results have been successfully fabricated and tested

Keywords

finite element analysis; heat conduction; insulating thin films; optimisation; spark chambers; spark gaps; sparks; thermal conductivity; Ansys6.1; FEM; MGC operational stability; MGCs; anode material damage; anode material selection studies; finite element methods; insulating layer; microgap gas chambers; spark damages; spark discharges; super high heat conductivity; topological optimization; Analytical models; Anodes; Conducting materials; Conductivity; Finite element methods; Insulation; Optimization methods; Performance analysis; Sparks; Transistors; Diamond thin films; finite element methods; microgap gas chambers; spark damage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2006.878129

Filename

1684103