DocumentCode :
1168923
Title :
DRAM – A Personal View
Author :
Foss, R.C.
Author_Institution :
Mosaid Technologies, Inc.
Volume :
13
Issue :
1
fYear :
2008
Firstpage :
50
Lastpage :
56
Abstract :
Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore´s Law, whose tentacles reach into every aspect of modern life.
Keywords :
CMOS integrated circuits; Companies; Random access memory; SDRAM; Substrates; Temperature sensors; Transistors;
fLanguage :
English
Journal_Title :
Solid-State Circuits Society Newsletter, IEEE
Publisher :
ieee
ISSN :
1098-4232
Type :
jour
DOI :
10.1109/N-SSC.2008.4785693
Filename :
4785693
Link To Document :
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