Title :
DRAM – A Personal View
Author_Institution :
Mosaid Technologies, Inc.
Abstract :
Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore´s Law, whose tentacles reach into every aspect of modern life.
Keywords :
CMOS integrated circuits; Companies; Random access memory; SDRAM; Substrates; Temperature sensors; Transistors;
Journal_Title :
Solid-State Circuits Society Newsletter, IEEE
DOI :
10.1109/N-SSC.2008.4785693