DocumentCode :
1169044
Title :
VLSI-TSA and VLSI-DAT to Convene on 21–25 April in Hsinchu, Taiwan, 15th International Symposium on VLSI Technology, Systems, and Applications & 4th VLSI Design, Automation and Test
Author :
Wu, Clara
Author_Institution :
Symposia Secretariat, clara@itri.org.tw
Volume :
13
Issue :
1
fYear :
2008
Firstpage :
69
Lastpage :
69
Abstract :
15th International Symposium on VLSI Technology, Systems, and Applications & 4th VLSI Design, Automation and Test Divided into two separate annual symposia since 2005, VLSI TSA-DAT lasts for two and a half days in the same week, with a one day overlap. In 2008 each symposium will feature three keynote speakers. The aim of the joint conference is to bring together scientists and engineers actively engaged in research, development, and manufacturing on VLSI technology, systems, and applications and on VLSI design, automation and test to discuss current progress in this field.
fLanguage :
English
Journal_Title :
Solid-State Circuits Society Newsletter, IEEE
Publisher :
ieee
ISSN :
1098-4232
Type :
jour
DOI :
10.1109/N-SSC.2008.4785705
Filename :
4785705
Link To Document :
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