DocumentCode :
1169063
Title :
High-speed photoconductive switch based on low-temperature GaAs transferred on SiO2-Si substrate
Author :
Mikulics, M. ; Xuemei Zheng ; Adam, R. ; Sobolewski, R. ; Kordos, P.
Author_Institution :
Inst. of Thin Films & Interfaces, Res. Centre Julich, Germany
Volume :
15
Issue :
4
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
528
Lastpage :
530
Abstract :
We report high-speed photoconductive switches based on low-temperature (LT) grown GaAs on Si substrate. Epitaxially grown LT GaAs was separated from its substrate, transferred on an SiO2-coated Si substrate and integrated with a transmission line. The 10×20-μm2 switches exhibit high breakdown voltage and low dark currents (<10/sup -7/ A at 100 V). The photoresponse at 810 nm shows electrical transients with /spl sim/0.55-ps full-width at half-maximum and /spl sim/0.37-ps decay time, both independent on the bias voltage up to the tested limit of 120 V. The photoresponse amplitude increases up to /spl sim/0.7 V with increased bias and the signal bandwith is /spl sim/500 GHz. The freestanding LT GaAs switches are best suited for ultrafast optoelectronic testing since they can be placed at virtually any point on the test circuit.
Keywords :
III-V semiconductors; dark conductivity; gallium arsenide; infrared detectors; molecular beam epitaxial growth; photoconducting switches; photodetectors; 0.37 ps; 0.55 ps; 10 micron; 100 V; 120 V; 20 micron; 810 nm; GaAs; Si; Si substrate; SiO/sub 2/; SiO/sub 2/-Si substrate; bias voltage; epitaxially grown; high breakdown voltage; high-speed photoconductive switch; low dark currents; low-temperature GaAs; low-temperature grown GaAs; optoelectronic testing; photoresponse amplitude; signal bandwidth; substrate; test circuit; tested limit; transmission line; Breakdown voltage; Circuit testing; Dark current; Gallium arsenide; Photoconductivity; Power system transients; Substrates; Switches; Switching circuits; Transmission lines;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2003.809264
Filename :
1190192
Link To Document :
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