Title :
The construction of probabilistic reliability model with one-shot device testing data
Author_Institution :
Novosibirsk State Tech. Univ., Novosibirsk, Russia
Abstract :
Summary form only given. In this paper, the parametric and nonparametric approaches to construction of probabilistic reliability model with one-shot device testing data are considered. Such data are referred to as current status data, which include right censored and left censored observations (no complete observations at all). Statistical properties of maximum likelihood estimates of distribution parameters have been investigated. The algorithm for nonparametric estimation of unknown distribution function for such kind of data has been proposed.
Keywords :
maximum likelihood estimation; nonparametric statistics; probability; reliability; distribution parameters; maximum likelihood estimation; nonparametric estimation approach; one-shot device testing data; parametric approaches; probabilistic reliability model; statistical properties; unknown distribution function; Abstracts; Data models; Educational institutions; Maximum likelihood estimation; Probabilistic logic; Reliability; Testing;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2014 12th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4799-6019-4
DOI :
10.1109/APEIE.2014.7040821