The construction of probabilistic reliability model with one-shot device testing data

Author

Chimitova, E.V.

Author_Institution

Novosibirsk State Tech. Univ., Novosibirsk, Russia

fYear

2014

fDate

2-4 Oct. 2014

Firstpage

1

Lastpage

1

Abstract

Summary form only given. In this paper, the parametric and nonparametric approaches to construction of probabilistic reliability model with one-shot device testing data are considered. Such data are referred to as current status data, which include right censored and left censored observations (no complete observations at all). Statistical properties of maximum likelihood estimates of distribution parameters have been investigated. The algorithm for nonparametric estimation of unknown distribution function for such kind of data has been proposed.

Keywords

maximum likelihood estimation; nonparametric statistics; probability; reliability; distribution parameters; maximum likelihood estimation; nonparametric estimation approach; one-shot device testing data; parametric approaches; probabilistic reliability model; statistical properties; unknown distribution function; Abstracts; Data models; Educational institutions; Maximum likelihood estimation; Probabilistic logic; Reliability; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Actual Problems of Electronics Instrument Engineering (APEIE), 2014 12th International Conference on

Conference_Location

Novosibirsk

Print_ISBN

978-1-4799-6019-4

Type

conf

DOI

10.1109/APEIE.2014.7040821

Filename

7040821