• DocumentCode
    1169450
  • Title

    Prediction of Solder Bump Formation in Solder Jet Packaging Process

  • Author

    Wang, Wei ; Hong, Fangjun ; Qiu, Huihe

  • Author_Institution
    Dept. of Thermal Energy Eng., Beijing Polytech. Univ.
  • Volume
    29
  • Issue
    3
  • fYear
    2006
  • Firstpage
    486
  • Lastpage
    493
  • Abstract
    Precise solder bump shape prediction is crucial for the application of the solder jet bumping process to microelectronic component packaging. In the present study, numerical simulation of both the dynamics and phase change responses during a metal droplet impingement is conducted by introducing a nonconstant interfacial heat transfer coefficient, which varies with time and position. Comparison between the numerical and experimental results for a large metal droplet demonstrates the validity of the numerical method. The results of many simulation cases are presented corresponding to typical solder jet bumping conditions. Variations in the impact velocity, initial droplet size, and droplet temperature and substrate temperature are investigated to understand their impact on the formation of solder bumps
  • Keywords
    heat transfer; integrated circuit packaging; soldering; thermal management (packaging); droplet temperature; heat transfer coefficient; impact velocity; initial droplet size; metal droplet impingement; microelectronic component packaging; phase change response; solder bump formation; solder bump shape prediction; solder jet packaging; substrate temperature; Electronic packaging thermal management; Electronics packaging; Heat transfer; Microelectronics; Rough surfaces; Shape; Surface roughness; Temperature; Thermal conductivity; Viscosity; Microelectronic component packaging; solder bump;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2006.880519
  • Filename
    1684169