• DocumentCode
    1169473
  • Title

    Space Charge Observation in Aramid/Epoxy Insulations Under DC Electric Fields

  • Author

    Fukunaga, Kaori ; Okamoto, Kenji ; Maeno, Takashi

  • Author_Institution
    EMC Project Office, Nat. Inst. of Inf. & communications Technol., Tokyo
  • Volume
    29
  • Issue
    3
  • fYear
    2006
  • Firstpage
    502
  • Lastpage
    507
  • Abstract
    With the progress of printed circuit technology, the reliability of bulk insulation has become important, as well as that of surface insulation, particularly in multilayer boards and embedded boards. We observed the space charge behavior of various insulating materials used in printed circuit boards, and found that internal charges move in aramid/epoxy specimens under dc electric fields. The electric field near the surface of the specimen, therefore, was increased to have more than twice the strength of the average applied field. The space charge profile was influenced by the internal structure, and its formation was accelerated by the increase of temperature. Since the space charge profile affects the internal electric field distribution, the internal charge behavior should be examined with respect to the design of the insulation of a printed circuit board
  • Keywords
    electric field effects; epoxy insulation; insulating materials; printed circuits; reliability; DC electric fields; aramid-epoxy insulations; bulk insulation; embedded boards; insulating materials; internal charge behavior; ion migration; multilayer boards; printed circuit technology; space charge behavior; surface insulation; Acoustic pulses; Acoustic waves; Circuit testing; Dielectrics and electrical insulation; Electronic equipment testing; Nonhomogeneous media; Printed circuits; Pulse generation; Pulsed electroacoustic methods; Space charge; Ion migration; space charge pulsed electroacoustic method;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2005.853173
  • Filename
    1684171