• DocumentCode
    116965
  • Title

    Device for regulating the temperature of the power transistors during the test

  • Author

    Nikolaevich, Bespalov Nikolay ; Vladimirovich, Ilyin Mickhail ; Alekseevich, Leontyev Ilya

  • fYear
    2014
  • fDate
    2-4 Oct. 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The article discusses a device for temperature control of semiconductor devices used in determining their heat-sensitive and electrical characteristics and parameters. To regulate and stabilize the temperature of semiconductor device used Peltier elements.
  • Keywords
    Peltier effect; power transistors; semiconductor device testing; temperature control; Peltier elements; electrical characteristics; heat-sensitivity; power transistors; semiconductor devices; temperature control; temperature regulation; temperature stability; Abstracts; Power transistors; Resistance heating; Temperature; Temperature sensors; a Peltier element; temperature control; temperature-sensitive parameters Semiconductors; thermoelectric module;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electronics Instrument Engineering (APEIE), 2014 12th International Conference on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4799-6019-4
  • Type

    conf

  • DOI
    10.1109/APEIE.2014.7040829
  • Filename
    7040829