Title :
Effects of the interaction of neighboring structures on the latch-up behavior of CMOS ICs
Author :
Menozzi, Roberto ; Selmi, Luca ; Sangiorgi, Enrico ; Riccò, Bruno
Author_Institution :
Dept. of Inf. Eng., Parma Univ., Italy
fDate :
8/1/1991 12:00:00 AM
Abstract :
An experimental investigation on the interaction between different parasitic devices in CMOS ICs from the point of view of latchup triggering is outlined. The study, carried out by means of ad hoc test structures, shows that this interaction: (a) can lead to significant increase in latchup susceptibility; (b) can involve devices very distant from one another; and (c) is not always suppressed by guard ring protections. The main features of the experimental results are discussed and explained
Keywords :
CMOS integrated circuits; integrated circuit testing; CMOS ICs; ad hoc test structures; guard ring protections; latch-up behavior; latchup susceptibility; latchup triggering; neighboring structures; parasitic devices; Boron; CMOS integrated circuits; Circuit testing; Implants; Numerical simulation; PROM; Performance analysis; Performance evaluation; Physics; Protection;
Journal_Title :
Electron Devices, IEEE Transactions on
