Title :
Segmentation of multiple salient closed contours from real images
Author :
Mahamud, Shyjan ; Williams, Lance R. ; Thornber, Karvel K. ; Xu, Kanglin
Author_Institution :
Dept. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
4/1/2003 12:00:00 AM
Abstract :
Using a saliency measure based on the global property of contour closure, we have developed a segmentation method which identifies smooth closed contours bounding objects of unknown shape in real images. The saliency measure incorporates the Gestalt principles of proximity and good continuity that previous methods have also exploited. Unlike previous methods, we incorporate contour closure by finding the eigenvector with the largest positive real eigenvalue of a transition matrix for a Markov process where edges from the image serve as states. Element (i, j) of the transition matrix is the conditional probability that a contour which contains edge j will also contain edge i. We show how the saliency measure, defined for individual edges, can be used to derive a saliency relation, defined for pairs of edges, and further show that strongly-connected components of the graph representing the saliency relation correspond to smooth closed contours in the image. Finally, we report for the first time, results on large real images for which segmentation takes an average of about 10 seconds per object on a general-purpose workstation.
Keywords :
Markov processes; computer vision; edge detection; eigenvalues and eigenfunctions; image segmentation; matrix algebra; Gestalt principles; Markov chains; Markov process; conditional probability; contour closure; edge detection; eigenvalue; eigenvector; general-purpose workstation; good continuity; graph; image segmentation; multiple salient closed contour segmentation; proximity; saliency measure; saliency relation; transition matrix; Cost function; Eigenvalues and eigenfunctions; Image segmentation; Layout; Libraries; Markov processes; Measurement standards; Shape measurement; Stochastic processes; Workstations;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2003.1190570