SSCS-Green Mountain Organizes 17th IEEE North Atlantic Test Workshop, IEEE NATW Special Session on Solid-State Circuits & System Test Held on 14–16 May, 2008

Sponsored by the SSCS-Green Mountain chapter on May 14-16, 2008, the 17th annual North Atlantic Test Workshop (NATV) included a special session on solid-state circuits and system test focused on advances in built-in self-test for 65nm and 45nm nodes, adaptive test, and on-product reliability testing. Featured presenters were IBM´s Mike Ouellette, Matt Grady and Kevin Stawiasz.