Title : 
A 1.8-V 128-Mb mobile DRAM with double boosting pump, hybrid current sense amplifier, and dual-referenced adjustment scheme for temperature sensor
         
        
            Author : 
Sim, Jae-Yoon ; Yoon, Hongil ; Chun, Ki-Chul ; Lee, Hyun-Seok ; Hong, Sang-Pyo ; Lee, Kyu-Chan ; Yoo, Jei-Hwan ; Seo, Dong-I ; Cho, Soo-In
         
        
            Author_Institution : 
Memory Div., Samsung Electron. Co. Ltd., Kyunggi-Do, South Korea
         
        
        
        
        
            fDate : 
4/1/2003 12:00:00 AM
         
        
        
        
            Abstract : 
To verify three important circuit schemes suitable for DRAMs in mobile applications, a 1.8-V 128-Mb SDRAM was implemented with a 0.15-μm technology. To achieve an ideal 33% efficiency, the double boosting pump uses two capacitor´s series connection at pumping phase, while they are precharged in parallel. The hybrid folded current sense amplifier together with a novel replica inverter connection improved power and speed performances. Also, a dual-referenced adjustment scheme for a temperature sensor was proposed to allow a very high accuracy in tuning. Without loss in productivity, the implemented dual-referenced searching technique achieved tuning error of less than ±2.5°C.
         
        
            Keywords : 
CMOS memory circuits; DRAM chips; application specific integrated circuits; circuit tuning; low-power electronics; temperature sensors; 0.15 micron; 1.8 V; 128 Mbit; 33 percent; SDRAM; double boosting pump; dual-referenced adjustment scheme; hybrid current sense amplifier; mobile applications; replica inverter connection; temperature sensor; tuning error; Boosting; Circuit testing; Degradation; Low voltage; Mobile computing; Multiaccess communication; Random access memory; SDRAM; Temperature sensors; Threshold voltage;
         
        
        
            Journal_Title : 
Solid-State Circuits, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JSSC.2003.809514