DocumentCode
1170187
Title
Effective optical transit time in direct electro-optic sampling of GaAs coplanar integrated circuits
Author
Shibata, Takuma ; Natatsuma, T. ; Sano, Eiichi
Author_Institution
NTT LSI Labs., Kanagawa, Japan
Volume
25
Issue
12
fYear
1989
fDate
6/8/1989 12:00:00 AM
Firstpage
771
Lastpage
773
Abstract
The effective optical transit time tau EOTT in direct electro-optic sampling of various coplanar lines is calculated on the assumption of TEM-mode signal propagation. It is shown that tau EOTT strongly depends on the sampling position. tau EOTT of 1-2 ps at the best sampling point are calculated for the reflection-mode probing of lines in MMICs which is considered to be the ultimate limit of measurement time resolution.
Keywords
III-V semiconductors; MMIC; gallium arsenide; integrated circuit testing; GaAs; GaAs coplanar integrated circuits; MMICs; TEM-mode signal propagation; coplanar lines; direct electro-optic sampling; effective optical transit time; measurement time resolution; reflection-mode probing; sampling position;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19890521
Filename
31889
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