Title :
Effective optical transit time in direct electro-optic sampling of GaAs coplanar integrated circuits
Author :
Shibata, Takuma ; Natatsuma, T. ; Sano, Eiichi
Author_Institution :
NTT LSI Labs., Kanagawa, Japan
fDate :
6/8/1989 12:00:00 AM
Abstract :
The effective optical transit time tau EOTT in direct electro-optic sampling of various coplanar lines is calculated on the assumption of TEM-mode signal propagation. It is shown that tau EOTT strongly depends on the sampling position. tau EOTT of 1-2 ps at the best sampling point are calculated for the reflection-mode probing of lines in MMICs which is considered to be the ultimate limit of measurement time resolution.
Keywords :
III-V semiconductors; MMIC; gallium arsenide; integrated circuit testing; GaAs; GaAs coplanar integrated circuits; MMICs; TEM-mode signal propagation; coplanar lines; direct electro-optic sampling; effective optical transit time; measurement time resolution; reflection-mode probing; sampling position;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890521
