• DocumentCode
    1170197
  • Title

    Modeling plasma immersion ion implantation under trapezoidal voltage pulses

  • Author

    Barroso, Joaquim José ; Rossi, Jóse Osvaldo ; Ueda, Mário

  • Author_Institution
    Associated Plasma Lab., Nat. Inst. for Space Res., Campos, Brazil
  • Volume
    31
  • Issue
    1
  • fYear
    2003
  • fDate
    2/1/2003 12:00:00 AM
  • Firstpage
    104
  • Lastpage
    111
  • Abstract
    In plasma immersion ion implantation (PIII), ions are extracted from the plasma and implanted in a target subjected to high negative voltage pulses. PIII models assume that the uncovering of enough ions at the moving sheath edge establishes a space-charge-limited ion flow that supplies the ion implant current at the target. The present paper reexamines this assumption in one-dimensional planar geometry by relating the implant current at the target to the Child law current through a delay time function that properly accounts for the transit time of the ion through the sheath. Comparison of the total current calculated both at the target and at the leading edge of the sheath demonstrates that the model provides accurate results as long as the ion time scale is shorter than the characteristic times of the applied voltage waveform.
  • Keywords
    plasma immersion ion implantation; plasma sheaths; Child law current; applied voltage waveform characteristic times; high negative voltage pulses; ion time scale; one-dimensional planar geometry; plasma immersion ion implantation; sheath edge; space-charge-limited ion flow; total current; transit time; trapezoidal voltage pulses; Frequency; Geometry; Implants; Plasma accelerators; Plasma density; Plasma immersion ion implantation; Plasma properties; Plasma sheaths; Plasma waves; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2003.808871
  • Filename
    1190682