DocumentCode :
1170197
Title :
Modeling plasma immersion ion implantation under trapezoidal voltage pulses
Author :
Barroso, Joaquim José ; Rossi, Jóse Osvaldo ; Ueda, Mário
Author_Institution :
Associated Plasma Lab., Nat. Inst. for Space Res., Campos, Brazil
Volume :
31
Issue :
1
fYear :
2003
fDate :
2/1/2003 12:00:00 AM
Firstpage :
104
Lastpage :
111
Abstract :
In plasma immersion ion implantation (PIII), ions are extracted from the plasma and implanted in a target subjected to high negative voltage pulses. PIII models assume that the uncovering of enough ions at the moving sheath edge establishes a space-charge-limited ion flow that supplies the ion implant current at the target. The present paper reexamines this assumption in one-dimensional planar geometry by relating the implant current at the target to the Child law current through a delay time function that properly accounts for the transit time of the ion through the sheath. Comparison of the total current calculated both at the target and at the leading edge of the sheath demonstrates that the model provides accurate results as long as the ion time scale is shorter than the characteristic times of the applied voltage waveform.
Keywords :
plasma immersion ion implantation; plasma sheaths; Child law current; applied voltage waveform characteristic times; high negative voltage pulses; ion time scale; one-dimensional planar geometry; plasma immersion ion implantation; sheath edge; space-charge-limited ion flow; total current; transit time; trapezoidal voltage pulses; Frequency; Geometry; Implants; Plasma accelerators; Plasma density; Plasma immersion ion implantation; Plasma properties; Plasma sheaths; Plasma waves; Voltage;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2003.808871
Filename :
1190682
Link To Document :
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