• DocumentCode
    1170348
  • Title

    New electron-probe instruments

  • Author

    Oatley, C.W.

  • Volume
    12
  • Issue
    8
  • fYear
    1966
  • fDate
    8/1/1966 12:00:00 AM
  • Firstpage
    282
  • Lastpage
    285
  • Abstract
    Details of the construction and mode of operation of the scanning electron microscope, the scanning electron diffractometer and the mirror electron microscope have recently been published elsewhere; in this article, the emphasis is on their uses and advantages.
  • Keywords
    electron beams; measurement by electrical methods;
  • fLanguage
    English
  • Journal_Title
    Electronics and Power
  • Publisher
    iet
  • ISSN
    0013-5127
  • Type

    jour

  • DOI
    10.1049/ep.1966.0212
  • Filename
    5177997
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1170348