In-process functional testing of pixel circuit in AM-OLEDs

Author

Lin, Yen-Chung ; Shieh, Han-Ping D.

Author_Institution

Opt. Storage & Display Lab., Nat. Chiao-Tung Univ., Hsinchu, Taiwan

Volume

52

Issue

10

fYear

2005

Firstpage

2157

Lastpage

2162

Abstract

This paper presents a functional testing scheme using a two-thin-film-transistor (TFT) pixel circuit of an active-matrix organic light-emitting display (AM-OLED). This pixel circuit and the co-operative electrical testing scheme can not only evaluate the characteristics of each TFT, but also determine the location of line and point defects in the TFT array. Information on defects can be used in a unique repair system that cutting and repairing these defects. Furthermore, the functional testing scheme can be applied as a part of yield management of the AM-OLED array process.

Keywords

display devices; organic light emitting diodes; production testing; thin film transistors; AM-OLED; active-matrix organic light-emitting display; electrical testing; functional testing; line defect; pixel circuit; point defects; repair system; thin-film transistor; yield management; Active matrix technology; Circuit faults; Circuit testing; Electrical fault detection; Flat panel displays; Inspection; Liquid crystal displays; Organic light emitting diodes; Thin film transistors; Voltage; Active-matrix (AM); active-matrix organic light-emitting display (AM-OLED); light-emitting diode (LED); organic light-emitting display (OLED); pixel; testing; thin-film transistor (TFT);

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2005.856173

Filename

1510904