Title :
In-process functional testing of pixel circuit in AM-OLEDs
Author :
Lin, Yen-Chung ; Shieh, Han-Ping D.
Author_Institution :
Opt. Storage & Display Lab., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
This paper presents a functional testing scheme using a two-thin-film-transistor (TFT) pixel circuit of an active-matrix organic light-emitting display (AM-OLED). This pixel circuit and the co-operative electrical testing scheme can not only evaluate the characteristics of each TFT, but also determine the location of line and point defects in the TFT array. Information on defects can be used in a unique repair system that cutting and repairing these defects. Furthermore, the functional testing scheme can be applied as a part of yield management of the AM-OLED array process.
Keywords :
display devices; organic light emitting diodes; production testing; thin film transistors; AM-OLED; active-matrix organic light-emitting display; electrical testing; functional testing; line defect; pixel circuit; point defects; repair system; thin-film transistor; yield management; Active matrix technology; Circuit faults; Circuit testing; Electrical fault detection; Flat panel displays; Inspection; Liquid crystal displays; Organic light emitting diodes; Thin film transistors; Voltage; Active-matrix (AM); active-matrix organic light-emitting display (AM-OLED); light-emitting diode (LED); organic light-emitting display (OLED); pixel; testing; thin-film transistor (TFT);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.856173
