Title :
Siberian Research Institute of Metrology. Stages of 70-year-old way and today tasks
Author :
Shuvalov, G.V. ; Evgrafov, V.I. ; Cherepanov, V.Ya. ; Palchun, Yu.A.
Author_Institution :
FSUE "Siberian Red Labor Banner Res. Inst. of Metrol.", Novosibirsk, Russia
Abstract :
The paper presents the main results of the research and development carried out in the Siberian Research Institute of Metrology for 70 years of its existence. There is represented the history of the Institute, as well as tasks that are met by members of the Institute nowadays.
Keywords :
measurement standards; Siberian Research Institute of Metrology; national standards; Area measurement; Electric variables measurement; Frequency measurement; Length measurement; Metrology; Semiconductor device measurement; Standards; Siberian Research Institute of Metrology; metrological support; national standards;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2014 12th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4799-6019-4
DOI :
10.1109/APEIE.2014.7040860
