DocumentCode
1170687
Title
Global interconnect width and spacing optimization for latency, bandwidth and power dissipation
Author
Li, Xiao-Chun ; Mao, Jun-Fa ; Huang, Hui-Fen ; Liu, Ye
Author_Institution
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., China
Volume
52
Issue
10
fYear
2005
Firstpage
2272
Lastpage
2279
Abstract
This paper addresses a novel methodology optimizing global interconnect width and spacing for International Technology Roadmap for Semiconductors technology nodes. Global interconnects with and without buffer insertion are considered. The effects of the width and spacing of global interconnects on performance, such as delay, bandwidth, total repeater area and energy dissipation, are analyzed. The product of delay and bandwidth is used as the figure of merit for simultaneous short latency and large bandwidth and the proposed methodology can optimize global interconnects for the maximal figure of merit. It is demonstrated that buffers should not be inserted in global interconnects if interconnect length is shorter than a critical length, which is a constant for a given technology. For global interconnects with buffer insertion, the optimal width and spacing have analytical expressions and are constants for a given technology. For global interconnects without buffer insertion, the optimal width and spacing are dependent on both the technology parameters and interconnect length and can be computed numerically.
Keywords
circuit optimisation; integrated circuit interconnections; integrated circuit modelling; buffer insertion; figure of merit; global interconnect optimization; global interconnect spacing; global interconnect width; interconnect bandwidth; power dissipation; signal delay; Bandwidth; Bit rate; Delay; Optimization methods; Paper technology; Power dissipation; Power system interconnection; Repeaters; System-on-a-chip; Wires; Bandwidth; buffer; delay; global interconnect optimization; width and spacing;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2005.856795
Filename
1510919
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