DocumentCode :
1170846
Title :
Special issue on advanced compact models and 45–nm modeling challenges
Volume :
52
Issue :
10
fYear :
2005
Firstpage :
2353
Lastpage :
2353
Abstract :
Provides notice of upcoming special issue(s) of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.857909
Filename :
1510933
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1170846