Title :
Discussion on fundamental issues of NPR measurements
Author :
Geens, Alain ; Rolain, Yves ; Van Moer, Wendy ; Vanhoenacker, Kenneth ; Schoukens, Johan
Author_Institution :
Electr. Meas. Dept., Vrije Univ. Brussel, Brussels, Belgium
Abstract :
This paper investigates the disagreement that exists between noise power ratio (NPR) measurements and a recently published statement that those measurements always underestimate the real nonlinear in-band distortions. A more fundamental approach to settle this discussion is presented. First, it is shown that nonlinear distortions can be split in different contributions, forming the fundamental parts of the NPR or in-band distortions. Next, measurement techniques are presented to obtain these different contributions.
Keywords :
electric noise measurement; microwave measurement; nonlinear distortion; NPR measurements; measurement techniques; microwave measurements; noise power ratio measurements; nonlinear in-band distortions; Band pass filters; Circuit noise; Distortion measurement; Measurement techniques; Noise generators; Noise measurement; Nonlinear distortion; Nonlinear systems; Power measurement; Signal to noise ratio;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.808034