Title :
Nonlinear parametric test
Author :
Teani, Carlos Roberto Negrão ; Jorge, Alberto Martins
Author_Institution :
Electron. & Microelectron. Dept., State Univ. of Campinas, Brazil
fDate :
2/1/2003 12:00:00 AM
Abstract :
Using the nonlinear behavior of the structural components within the integrated circuit, the state space may be studied, and one observable state trajectory can identify parametric variations through Poincare maps. An opamp parametric test, using the proposed methodology, is presented.
Keywords :
Poincare mapping; integrated circuit testing; state-space methods; virtual instrumentation; Poincare maps; integrated circuit test; nonlinear behavior; nonlinear parametric test; observable state trajectory; opamp; parametric variations; state space; structural components; virtual instrumentation; Circuit testing; Instruments; Integrated circuit manufacture; Integrated circuit testing; Nonlinear dynamical systems; Nonlinear systems; State-space methods; System testing; Time measurement; Trajectory;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.808024
