DocumentCode :
1171947
Title :
Comparison of CMOS and BiCMOS 1-Mbit DRAM performance
Author :
Watanabe, Takao ; Kitsukawa, Goro ; Kawajiri, Yoshiki ; Itoh, Kiyoo ; Hori, Ryoichi ; Ouchi, Yoshiaki ; Kawahara, Takayuki ; Matsumoto, Tetsuro
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Volume :
24
Issue :
3
fYear :
1989
fDate :
6/1/1989 12:00:00 AM
Firstpage :
771
Lastpage :
778
Abstract :
The advantage of BiCMOS technology over CMOS technology in terms of the access time and the power dissipation is demonstrated for a 1.3-μm 1-Mb DRAM with a TTL (transistor-transistor logic) interface. Two key results are obtained. One is that a BiCMOS driver achieves a 23% lower delay time and 28% lower power dissipation compared with a CMOS driver. This is due to the inherently small input gate capacitance of the BiCMOS inverter and the small number of inverter stages required to make the BiCMOS driver. The other result is that a 1-Mb BiCMOS DRAM incorporating the BiCMOS driver provides higher performance in terms of a 36% faster access time and 24% lower power dissipation after fabrication process deviations and temperature changes. The resistance to the process deviations and temperature changes of the BiCMOS is responsible for such excellent performance
Keywords :
BIMOS integrated circuits; CMOS integrated circuits; integrated memory circuits; random-access storage; 1 Mbit; 1.3 micron; BiCMOS; CMOS; DRAM performance; TTL; access time; delay time; fabrication process deviations; input gate capacitance; inverter stages; power dissipation; temperature changes; BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Capacitance; Delay effects; Driver circuits; Inverters; Power dissipation; Random access memory; Temperature;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.32039
Filename :
32039
Link To Document :
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