Title :
A 13-b 1.1-MHz oversampled DAC with semidigital reconstruction filtering
Author :
Francese, Pier Andrea ; Ferrat, Pascal ; Huang, Qiuting
Author_Institution :
ETH Integrated Syst. Lab., Zurich, Switzerland
Abstract :
A digital-to-analog converter (DAC) composed of a cascaded digital ΣΔ modulator and the combination of a semidigital/digital finite-impulse response (FIR) and an infinite-impulse response (IIR)-SC/RC filter is described. The architecture enables the analog linear reconstruction of 16× oversampled digital signals. With the analog section implemented in CMOS 0.18-μm and the digital part programmed into a field-programmable gate array (FPGA), the modulator plus reconstruction filter achieves a peak SNR of 78 dB. The spurious-free dynamic range reaches 80 dB and stays better than 73 dB within the 1.104-MHz signal band. A missing-tone-power ratio of 70 dB, demonstrated for a signal with 15-dB peak-to-average ratio, proves that the solution is suitable for ADSL-CO transmitters.
Keywords :
CMOS integrated circuits; FIR filters; IIR filters; digital signals; digital-analogue conversion; field programmable gate arrays; signal reconstruction; switched capacitor filters; 0.18 micron; 1.1 MHz; 1.104 MHz; 13 bits; ADSL-CO transmitters; SC/RC filter; analog linear reconstruction; broadband transmitter; digital SA modulator; digital signals; digital-to-analog converter; field-programmable gate array; finite-impulse response; infinite-impulse response; reconstruction filter; semidigital reconstruction filtering; sigma-delta modulation; switched-capacitor filter; xDSL; Digital filters; Digital modulation; Digital-analog conversion; Dynamic range; Field programmable analog arrays; Field programmable gate arrays; Filtering; Finite impulse response filter; Modulation coding; Peak to average power ratio; 211;analog conversion; 211;delta modulation; 65; Broadband transmitter; FIR; SC; digital filter; reconstruction filter; semidigital finite-impulse response; sigma switched-capacitor; xDSL;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.836238