DocumentCode
1172536
Title
Experimental analysis of millimeter wave coplanar waveguide slow wave structures on GaAs
Author
Spickermann, Ralph ; Dagli, Nadir
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume
42
Issue
10
fYear
1994
fDate
10/1/1994 12:00:00 AM
Firstpage
1918
Lastpage
1924
Abstract
Microwave coplanar waveguide slow wave structures suitable for use in traveling wave electrooptic modulators were experimentally investigated to 40 GHz. Velocity slowing is achieved by introducing periodic slots in the ground planes. Structures both on semiinsulating GaAs substrates and on epitaxial layers grown by molecular beam epitaxy on semiinsulating GaAs substrates were examined. In the measurements the thru-reflect-line calibration method was used and its limitations are discussed. The characteristic impedance, phase velocity and loss coefficient of these lines were extracted from measured S-parameters. Effects of various dimensions on these line properties are presented and discussed. Results indicate that significant phase velocity slowing without dispersion at least up to 40 GHz is possible with this approach. This is true both on semi-insulating GaAs substrates and specially designed epitaxial layers. A design approach to achieve a specified phase velocity and characteristic impedance is given
Keywords
III-V semiconductors; MMIC; S-parameters; electro-optical devices; gallium arsenide; molecular beam epitaxial growth; waveguides; 40 GHz; GaAs; S-parameters; characteristic impedance; ground planes; loss coefficient; millimeter wave coplanar waveguide; molecular beam epitaxy; periodic slots; phase velocity; slow wave structures; thru-reflect-line calibration method; traveling wave electrooptic modulators; velocity slowing; Calibration; Coplanar waveguides; Electrooptic modulators; Electrooptical waveguides; Epitaxial layers; Gallium arsenide; Impedance; Millimeter wave technology; Molecular beam epitaxial growth; Substrates;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.320774
Filename
320774
Link To Document