DocumentCode
1172658
Title
Linearity analysis of CMOS for RF application
Author
Kang, Sanghoon ; Choi, Byounggi ; Kim, Bumman
Author_Institution
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Kyoungbuk, South Korea
Volume
51
Issue
3
fYear
2003
fDate
3/1/2003 12:00:00 AM
Firstpage
972
Lastpage
977
Abstract
The linearity of CMOS has been analyzed using the Taylor series. Transconductance and output conductance are two dominant nonlinear sources of CMOS. At a low frequency, the transconductance is a dominant nonlinear source for a low load impedance, but for a usual operation level impedance the output conductance is a dominant nonlinear source. Capacitances and the substrate network do not generate any significant nonlinearity, but they suppress output-conductance nonlinearity at a high frequency because output impedance is reduced by the capacitive shunts, and output voltage swing is also reduced. Therefore, above 2-3 GHz, the transconductance becomes a dominant nonlinear source for a usual load impedance. If these capacitive elements are tuned out for a power match, the behavior becomes similar to the low-frequency case. As gate length is reduced, the transconductance becomes more linear, but the output conductance becomes more nonlinear. At a low frequency, CMOS linearity is degraded as the gate length becomes shorter, but at a higher frequency (above 2-3 GHz), linearity can be improved.
Keywords
CMOS integrated circuits; circuit simulation; integrated circuit modelling; radiofrequency integrated circuits; series (mathematics); 2 to 3 GHz; BSIM3-based model; CMOS; RF application; Taylor series; capacitive shunts; gate length; linearity analysis; load impedance; nonlinear sources; operation level impedance; output conductance; power match; transconductance; CMOS technology; Capacitance; Impedance; Linearity; Microwave technology; Radio frequency; Semiconductor device modeling; Taylor series; Transconductance; Voltage;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2003.808709
Filename
1191756
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