• DocumentCode
    1172658
  • Title

    Linearity analysis of CMOS for RF application

  • Author

    Kang, Sanghoon ; Choi, Byounggi ; Kim, Bumman

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Kyoungbuk, South Korea
  • Volume
    51
  • Issue
    3
  • fYear
    2003
  • fDate
    3/1/2003 12:00:00 AM
  • Firstpage
    972
  • Lastpage
    977
  • Abstract
    The linearity of CMOS has been analyzed using the Taylor series. Transconductance and output conductance are two dominant nonlinear sources of CMOS. At a low frequency, the transconductance is a dominant nonlinear source for a low load impedance, but for a usual operation level impedance the output conductance is a dominant nonlinear source. Capacitances and the substrate network do not generate any significant nonlinearity, but they suppress output-conductance nonlinearity at a high frequency because output impedance is reduced by the capacitive shunts, and output voltage swing is also reduced. Therefore, above 2-3 GHz, the transconductance becomes a dominant nonlinear source for a usual load impedance. If these capacitive elements are tuned out for a power match, the behavior becomes similar to the low-frequency case. As gate length is reduced, the transconductance becomes more linear, but the output conductance becomes more nonlinear. At a low frequency, CMOS linearity is degraded as the gate length becomes shorter, but at a higher frequency (above 2-3 GHz), linearity can be improved.
  • Keywords
    CMOS integrated circuits; circuit simulation; integrated circuit modelling; radiofrequency integrated circuits; series (mathematics); 2 to 3 GHz; BSIM3-based model; CMOS; RF application; Taylor series; capacitive shunts; gate length; linearity analysis; load impedance; nonlinear sources; operation level impedance; output conductance; power match; transconductance; CMOS technology; Capacitance; Impedance; Linearity; Microwave technology; Radio frequency; Semiconductor device modeling; Taylor series; Transconductance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2003.808709
  • Filename
    1191756