Title :
Investigation of Errors Related to the Measured Virtual Front Time T1 of Lightning Impulses
Author :
Qing-Cheng, Qi ; Zaengl, W.S.
Author_Institution :
Electrical Engineering Dept. Tsinghua University
Keywords :
Circuit testing; Delay; Dielectric measurements; IEC standards; Impulse testing; Lightning; Shape measurement; Stress measurement; Time measurement; Voltage;
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
DOI :
10.1109/TPAS.1983.317737
