Title :
Automatic recalibration of an active structured light vision system
Author :
Li, Y.F. ; Chen, S.Y.
Author_Institution :
Dept. of Manuf. Eng. & Eng. Manage., City Univ. of Hong Kong, China
fDate :
4/1/2003 12:00:00 AM
Abstract :
A structured light vision system using pattern projection is useful for robust reconstruction of three-dimensional objects. One of the major tasks in using such a system is the calibration of the sensing system. This paper presents a new method by which a two-degree-of-freedom structured light system can be automatically recalibrated, if and when the relative pose between the camera and the projector is changed. A distinct advantage of this method is that neither an accurately designed calibration device nor the prior knowledge of the motion of the camera or the scene is required. Several important cues for self-recalibration are explored. The sensitivity analysis shows that high accuracy in-depth value can be achieved with this calibration method. Some experimental results are presented to demonstrate the calibration technique.
Keywords :
active vision; calibration; matrix algebra; sensitivity analysis; active structured light vision system; automatic recalibration; calibration; pattern projection; robust reconstruction; sensitivity analysis; Calibration; Cameras; Layout; Machine vision; Position measurement; Robot vision systems; Robotics and automation; Robustness; Sensitivity analysis; Three dimensional displays;
Journal_Title :
Robotics and Automation, IEEE Transactions on
DOI :
10.1109/TRA.2003.808859