Title :
Path loss, scattering and multipath delay statistics in four European cities for digital cellular and microcellular radiotelephone
Author :
Seidel, Scott Y. ; Rappaport, Theodore S. ; Jain, Sanjiv ; Lord, Michael L. ; Singh, Rajendra
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fDate :
11/1/1991 12:00:00 AM
Abstract :
The authors present typical and worst-case root mean square (RMS) delay spreads and excess delay spreads (10 dB) and mean channel path loss at 900 MHz in four European cities using typical cellular and microcellular antenna locations. Several thousand power delay profile measurements were made at six typical cellular and microcellular base station locations in the four cities. The data were obtained at local worst-case time-dispersion locations over hundreds of kilometers of typical operating routes, such as highways, bridges, and city streets, and form the basis for statistical models which can be used to predict the percentage of locations or the percentage of time in which channels will possess particular values of RMS delay spread and excess delay spread. The effect of reference distance on wideband path loss and the propagation path loss laws for cellular and microcellular radio channels are given. Radar cross sections computed from the data for typical scatterers in cellular and microcellular radio channels are given
Keywords :
cellular radio; digital radio systems; radar cross-sections; radiotelephony; radiowave propagation; 900 MHz; European cities; RMS delay spread; UHF; antenna locations; base station locations; digital cellular radio; electromagnetic scattering; excess delay spreads; mean channel path loss; microcellular radio channels; microcellular radiotelephone; multipath delay statistics; power delay profile measurements; propagation path loss; radar cross sections; radiowave propagation; reference distance; time-dispersion locations; wideband path loss; Antenna measurements; Base stations; Cities and towns; Delay effects; Power measurement; Propagation losses; Radar scattering; Road transportation; Root mean square; Statistics;
Journal_Title :
Vehicular Technology, IEEE Transactions on