Title :
Stability analysis of current programmed a-Si:H AMOLED pixel circuits
Author :
Sakariya, Kapil ; Servati, Peyman ; Nathan, Arokia
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Ont., Canada
Abstract :
In this paper, we present self-compensating current mirror-based pixel circuits, and analyze basic stability issues to provide a deeper understanding of circuit operation, and the impact of thin film transistor bias nonidealities, which can lead to the long-term (and gradual) instabilities in pixel drive current. The analysis also provides the circuit designer a means to tailor the pixel drive current stability to the long-term brightness degradation characteristics of the organic light-emitting diode.
Keywords :
amorphous semiconductors; elemental semiconductors; organic light emitting diodes; silicon; thin film transistors; Si:H; active matrix; amorphous silicon; bias nonidealities; brightness degradation characteristics; current programmed AMOLED pixel circuits; organic light-emitting diode; pixel drive current stability; self-compensating current mirror-based pixel circuits; stability analysis; thin film transistor; threshold voltage shift; Active matrix organic light emitting diodes; Amorphous silicon; Circuit stability; Driver circuits; Organic light emitting diodes; Stability analysis; Switches; Switching circuits; Thin film transistors; Threshold voltage; 65; Active matrix; OLED; TFT; amorphous silicon; current programmed pixel circuit; organic light emitting diode; thin-film transistor; threshold voltage shift;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2004.838452
