DocumentCode :
1173885
Title :
Experimental observation and modified driving method to improve the high-temperature misfiring in AC PDP
Author :
Ryu, Jae-Hwa ; Choi, Joon-Young ; Lee, Ho-Jun ; Kim, Dong-Hyun ; Lee, Hae June ; Park, Chung-Hoo
Author_Institution :
Digital Plasma Display Panel Div., LG Electron. Inc., Gumi, South Korea
Volume :
51
Issue :
12
fYear :
2004
Firstpage :
2026
Lastpage :
2032
Abstract :
Misfiring is often observed during the high-temperature quality assurance test of plasma display panels. This limits the productivity of the plasma display panel industry. In this paper, experimental observations on the misfiring at high-panel temperatures have been performed through time-dependent discharge light output and static margin measurement. For the high-temperature condition, the firing voltage increment is found in both surface and facing discharges. This in turn increases time lag in address discharge, and results in increment of misfiring probability. In order to reduce this kind of misfiring, a modified method that applies automatically to a different slope of ramp erase pulse on the sustain electrode according to temperature variation is proposed. The experimental results show that controlling the slope of the ramp erase pulse is quite effective for compensating the temperature-dependent variation of reset and address discharge.
Keywords :
high-temperature techniques; plasma displays; AC plasma display panel; address discharge; facing discharges; firing voltage increment; high-panel temperatures; high-temperature misfiring; high-temperature quality assurance test; misfiring probability; modified driving method; ramp erase pulse; reset discharge; static margin measurement; surface discharging; temperature variation; time-dependent discharge light output; Firing; Performance evaluation; Plasma displays; Plasma measurements; Plasma temperature; Productivity; Quality assurance; Surface discharges; Testing; Voltage; 65; AC plasma display panel; PDP; address discharge; high-temperature misfiring;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2004.839112
Filename :
1362963
Link To Document :
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