• DocumentCode
    1174312
  • Title

    Multi-level logic minimization using implicit don´t cares

  • Author

    Bartlett, Karen A. ; Brayton, Robert K. ; Hachtel, Gary D. ; Jacoby, Reily M. ; Morrison, Christopher R. ; Rudell, Richard L. ; Sangiovanni-Vincentelli, Alberto ; Wang, Albert R.

  • Author_Institution
    Colorado Univ., Boulder, CO, USA
  • Volume
    7
  • Issue
    6
  • fYear
    1988
  • fDate
    6/1/1988 12:00:00 AM
  • Firstpage
    723
  • Lastpage
    740
  • Abstract
    An approach is described for the minimization of multilevel logic circuits. A multilevel representation of a block of combinational logic is defined, called a Boolean network. A procedure is then proposed, called ESPRESSOMLD, to transform a given Boolean network into a prime, irredundant, and R-minimal form. This procedure rests on the extension of the notions of primality and irredundancy, previously used only for two-level logic minimization, to combinational multilevel logic circuits. The authors introduce the concept of R-minimality, which implies minimality with respect to cube reshaping, and demonstrate the crucial role played by this concept in multilevel minimization. Theorems are given that prove the correctness of the proposed procedure. Finally, it is shown that prime and irredundant multilevel logic circuits are 100% testable for input and output single-stuck faults, and that these tests are provided as a byproduct of the minimization
  • Keywords
    combinatorial circuits; minimisation of switching nets; Boolean network; ESPRESSOMLD; R-minimal form; combinational logic; cube reshaping; irredundancy; minimization; multilevel logic circuits; primality; single-stuck faults; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Helium; Jacobian matrices; Logic circuits; Logic testing; Minimization; Silicon;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.3211
  • Filename
    3211