• DocumentCode
    1175429
  • Title

    Computer-aided noise analysis of MESFET and HEMT mixers

  • Author

    Rizzoli, Vittorio ; Mastri, Franco ; Cecchetti, C.

  • Author_Institution
    Dept. of Electron., Inf. & Syst., Bologna Univ., Italy
  • Volume
    37
  • Issue
    9
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    1401
  • Lastpage
    1410
  • Abstract
    A numerical approach to the noise analysis of MESFET and HEMT mixers of arbitrary topology is discussed. A qualitative picture of the complex physical mechanisms responsible for the generation of the intermediate frequency (IF) noise is outlined, and the corresponding computational algorithms are presented. The derivation of a noisy nonlinear model for the microwave FET is addressed, and it is shown that a satisfactory solution to this problem can be obtained by combining a conventional time-domain model with standard noise information. The method has been implemented in a computer program designed to work in conjunction with an existing general-purpose harmonic-balance simulator. An application is described in detail to demonstrate the excellent performance of this software tool
  • Keywords
    Schottky gate field effect transistors; circuit analysis computing; electron device noise; equivalent circuits; field effect transistor circuits; high electron mobility transistors; random noise; semiconductor device models; solid-state microwave circuits; HEMT mixers; IF noise; MESFET mixers; arbitrary topology; computational algorithms; computer aided noise analysis; computer program; general-purpose harmonic-balance simulator; intermediate frequency; microwave FET; microwave mixers; noisy nonlinear model; standard noise information; time-domain model; Computational modeling; Computer simulation; Frequency; HEMTs; MESFETs; Microwave FETs; Noise generators; Physics computing; Time domain analysis; Topology;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.32224
  • Filename
    32224