Title :
Success-driven learning in ATPG for preimage computation
Author :
Sheng, Shuo ; Hsiao, Michael S.
Abstract :
Unbounded model checking fundamentally requires either image or preimage calculations. We introduce a hybrid method for making preimage calculations using ATPG and binary decision diagrams (BDDs). Experimental results show that the proposed method achieves a speedup of two to three orders of magnitude over pure ATPG methods.
Keywords :
automatic test pattern generation; binary decision diagrams; computability; formal verification; logic circuits; logic simulation; logic testing; tree searching; ATPG preimage computation; binary decision diagram; success-driven learning; unbounded model checking; Automatic test pattern generation; Binary decision diagrams; Boolean functions; Circuits; Computational modeling; Data structures; Decision making; Engines; Formal verification; State-space methods;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2004.97
