Title :
Jitter measurements of high-speed serial links
Author :
Kossel, Marcel A. ; Schmatz, Martin L.
Author_Institution :
IBM Zurich Res. Lab., Ruschlikon, Switzerland
Abstract :
Jitter is one of the most important issues in the design and operation of high-speed serial links. We focus on the BERT scan method, a jitter characterization method based on scanning the bit error rate within the eye diagram.
Keywords :
timing circuits; timing jitter; BERT scan method; BIST function; bit error rate; eye diagram; high-speed serial links; jitter characterization method; jitter measurement; Bit error rate; Clocks; Density functional theory; Frequency; Histograms; Jitter; Laboratories; Random processes; Signal analysis; Voltage;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2004.93
